DAY 1

The Basics
Monday, June 16—

12:30-4:30pm
Introduction to Infrared Detection
Dr. A. W. Hoffman
Introduction to the sources, transmission, and detection of infrared radiation. Overview of detector history and current technology trends. Introduction to semiconductor physics and semiconductor structures used in detecting infrared.

5:00pm
Get Acquainted Beach Barbecue
(Bring sweater or jacket to class)

DAY 2

Focal Plane Electronics
Tuesday, June 17—

8:30am-12 noon & 12:30-4:00pm
Focal Plane Electronics
Mr. John L. Vampola
Detector signal preamplifiers, multiplexers and output buffers for multi-element arrays using readout integrated circuits. Theory of operation and application of circuit types. Introduction to “smart” focal planes. Primer on common CMOS processing utilized for infrared focal plane electronics. Effects of ionizing radiation on the performance of CMOS devices and ways to design for radiation-hardened applications. Includes hands-on electronics lab to provide experience in the operation of detector preamplifiers commonly found in infrared focal planes. These amplifiers include CTIA, DI, and SFD.

DAY 3

Detectors
Wednesday, June 18 —

8:30am-12 noon
Modern Infrared Detectors
Mr. William Radford
Surveys a variety of infrared detectors with an emphasis on application to focal plane arrays (FPAs). Provides an operational description of the various devices followed by a more detailed review of physics of detection and noise processes. Emphasis will be on photovoltaic arrays used in cooled FPAs and microbolometer arrays used in uncooled FPAs. Detailed review of material growth techniques, device architecture, and fabrication processes used in HgCdTe, InSb and VOx detector arrays. Survey of current state-of-the-art in detector array formats and performance. Discussion of key operational parameters that impact detector performance and producibility.

12:30-4:00pm
Infrared Detector Laboratory
Prof. Nadir Dagli and Faculty (Hoffman, Vampola, Vincent, Radford)
Hands-on measurements of spectral response, noise, detectivity and response times for photon and thermal detectors. Current-voltage characteristics of photo-diodes and modes of detection. Attendees will perform experiments under the guidance of the faculty. If possible, please bring a pocket calculator to the session.

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DAY 4

Test and Special topics
Thursday, June 19 —

8:30am-12 noon
Infrared Detector Testing
Mr. J. D. Vincent
Understanding testing of infrared detectors and focal planes with emphasis on key figures of merit and device specifications such as spectral response, responsive area, noise equivalent power, D*, noise equivalent temperature difference, and modulation transfer function. Descriptions of test equipment, techniques and algorithms.

12:30-1:30pm
Special Topic:
Commercialization of Infrared
Ms. Lucy Thoms-Harrington Reviews the early history of infrared with its roots in military and defense. Describes the transition of infrared first to astronomy and then to a variety of commercial applications. The factors enabling this change are discussed. Emerging markets will be explored as well as future trends.

1:30-3:30pm
Thermal Imaging System Demonstration
The thermal imaging system lab includes demonstrations of a wide range of infrared cameras and thermal sources; measurement of noise equivalent temperature difference; and signal processing and calibration algorithms.

4:00-6:00pm
Special event
Detector Manufacturer
Reception and Tours

The Santa Barbara area has the largest concentration of infrared industries in the world. Receptions and guided tours of at least two of these facilities are planned. Course registrants must provide their own transportation and carpooling is encouraged.

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DAY 5

Systems
Friday, June 20—

8:00am-2:00pm
Introduction to Infrared Systems

General infrared applications; IR camera/instrument designs panchromatic, multispectral and hyperspectral sensors, deployment modes, and system implementations; IR camera/instrument performance metrics (NEDT, NEDp,NESR, NET, MTF, etc.) and design trades; review of available IR focal plane technologies and their associated performance; IR focal plane utilization; system applications and system drivers; flowdown of system sensitivity and constraints to focal plane NEI and reference irradiance and dynamic range, including a detailed multispectral example.

2:00pm— Course Ends

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